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Experimental and Theoretical Characterization of Thick and Thin Films for Microwave Uses on 99.6% Alumina Substrates
Thick and Thin Films Microwave Uses 99.6% Alumina Substrates
2010/12/27
In a previous paper, we showed, with a microwave quality factor (Q) measurement, that in the X band and with alumina substrates, thick film losses are not worse than thin film losses when the inks are...